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Asai, Shiho; Limbeck, A.*
no journal, ,
no abstracts in English
Saegusa, Jun; Nagayama, Takehiro; Maeda, Satoshi; Okazaki, Tsutomu; Yoda, Tomoyuki; Takeishi, Minoru
no journal, ,
In the process of 
-ray spectrometry analyses for radioactivity measurements, the coincidence summing effect needs to be considered. In this study, the concidence summing correction factors for 605 and 796 keV -rays from various standard volume sources were evaluated based on the peak-to-total (P/T) ratio method. The results were compared with the values directly obtained from the measurements of these sources containing certified amount of 
Cs nuclide.
Nagayama, Takehiro; Maeda, Satoshi; Okazaki, Tsutomu; Yoda, Tomoyuki; Saegusa, Jun
no journal, ,
no abstracts in English
Okamoto, Yoshihiro; Osugi, Takeshi; Akabori, Mitsuo; Shiwaku, Hideaki; Yaita, Tsuyoshi
no journal, ,
Distribution and chemical state of cesium in clay minerals and fly ashes were investigated by using imaging XAFS technique. In the measurement, beam monitor and high sensitive CCD camera were used as X-ray intensity detector. In the imaging XAFS method, adding position sensitivity to XAFS can be achieved easily and heterogeneous samples can be used. In this presentation, advantage and limitation in the imaging XAFS technique were discussed and new applications such as correlation analysis between two elements in the sample were introduced.
Yabe, Makoto; Okamura, Hiroyuki; Sairenji, Shiho; Ohashi, Akira*; Naganawa, Hirochika; Shimojo, Kojiro
no journal, ,
no abstracts in English
Nojima, Takehiro; Esaka, Fumitaka; Yamamoto, Hiroyuki
no journal, ,
X-ray absorption spectroscopy (XAS) is one of the techniques for surface analysis of solids. Since the near edge structure depends on the chemical states of elements, XAS is widely applied to chemical states analysis. In this study, an XAS method was examined to perform depth profiling by changing electron energy for detection. Gold thin films with the thicknesses of 1, 2, 5 and 10 nm were deposited on Si(100) substrates by resistance heating. In XAS analysis, we measured Si-K edge and Au-M edge spectra of the films by detecting electrons with energies ranging from 5 to 50 eV. In the analysis of the Au thin film with a thickness of 5 nm, electron energy dependence of Au/Si ratio was clearly observed. In addition, similar electron energy dependences were observed for other Au thin films with the thicknesses of 1, 2 and 10 nm. These results indicate that this method is effective for non-destructive depth profiling of solid surface.